(Solved): need help, thank you! 1. When a chip fabrication facility is operating normally, the lifetime of a m ...
need help, thank you!
1. When a chip fabrication facility is operating normally, the lifetime of a microchip operated at temperature T, measured in degrees Celsius, is given by an exponential (λ) random variable X with expected value E[X]=1/λ=(200/T)2 years. Occasionally, the chip fabrication plant has contamination problems, and the chips tend to fail much more rapidly. To test for contamination problems, each day m chips are subjected to a one-day test at T=100∘C. Based on the number N of chips that fail in one day, design a signifieance test for the null hypothesis test H0 that the plant is operating normally. a) Find an expression for the significance level of the test as a function of m, the total number of chips tested such that the null hypothesis is rejected for N>0 b) How many chips must be tested for a significance level of 0.01 c) If we increase the temperature at which we test, does the number of chips needed increase of decrease, why?